English 中文

Optical Lab

ASE Optical Laboratory provides wafer-level (WL) optical test solution and optical thin-film characterization & simulation.


Driven by emerging Telecom/Datacom demands and applications for high-performance computing (HPC) and artificial intelligence (AI), silicon photonics (SiPh) is a promising technology that provides greater bandwidth, low latency transmission over longer distance, low power consumption and high-level package integration. In order to meet future SiPh demands and applications, ASE developed comprehensive optical testing capabilities to support SiPh products development.


Wafer Level Optical Test


  • Optical and electrical testing capabilities (Optical to Optical (O/O), Optical to Electrical(O/E)) for 200/300mm photonics wafers.
  • Optical insertion loss (IL)/polarization dependent loss (PDL) spectrum sweep. Photodetector (PD) responsivity measurement*.
  • Grating coupler test for various incident angles (eg. 8/10/12 deg.) with Single Mode Fiber (SMF) or multi-channel Fiber Array Unit (FAU) as optical probe.
  • C-, L-, or O-band tunable laser (1240~1380nm/1490~1640nm) equipped with polarization synthesizer and multi-channel optical power meter.
O/O testing with SMF
O/E testing with SMF and DC probe
O/E testing with FAU and DC probe cards


Optical thin-film Characterization, Modeling and Simulation


  • Transmittance/reflectivity
  • Wavelength spectrum
  • Dimension measurement
  • Optical structure optimization



This website uses Cookies to optimize your experience. By choosing to continue, you agree to the use of Cookies and our Cookie Terms. To know more about Cookies and how to enable and disable cookies, please see “How to change Cookie preferences or disable Cookies?” in our Cookie Terms.

Accept Cookies