Optical Lab

ASE Optical Laboratory provides wafer-level (WL) optical test solution and optical thin-film characterization & simulation.

Introduction

Driven by emerging Telecom/Datacom demands and applications for high-performance computing (HPC) and artificial intelligence (AI), silicon photonics (SiPh) is a promising technology that provides greater bandwidth, low latency transmission over longer distance, low power consumption and high-level package integration. In order to meet future SiPh demands and applications, ASE developed comprehensive optical testing capabilities to support SiPh products development.

Wafer Level Optical Test

Capability

Optical and electrical testing capabilities (Optical to Optical (O/O), Optical to Electrical(O/E)) for 200/300mm photonics wafers.
Optical insertion loss (IL)/polarization dependent loss (PDL) spectrum sweep. Photodetector (PD) responsivity measurement*.
Grating coupler test for various incident angles (eg. 8/10/12 deg.) with Single Mode Fiber (SMF) or multi-channel Fiber Array Unit (FAU) as optical probe.
C-, L-, or O-band tunable laser (1240~1380nm/1490~1640nm) equipped with polarization synthesizer and multi-channel optical power meter.

O/O testing with SMF

O/E testing with SMF and DC probe

O/E testing with FAU and DC probe cards

Optical thin-film Characterization, Modeling and Simulation

Capability

Transmittance/reflectivity
Wavelength spectrum
Dimension measurement
Optical structure optimization

Contact for enquiries

Electrical Lab

Material Lab

Stress & Thermal Lab

Chemical & Green
Technology Lab

Failure Analysis Lab

Optical Lab

Acoustic Lab

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