loading
English 中文

扇出型基板上晶片封裝

Chiplet integration* in high performance computing (HPC) applications is high on the agenda these days, with escalating demand for reliable advanced packaging technologies to achieve critical interconnection as efficiently as possible. At ASE, our high density FOCoS solutions offer that, and much more.

 

What is Fan-Out Chip on Substrate (FOCoS)?

FOCoS is a fan-out package flip-chip mounted on a high pin count ball grid array (BGA) substrate. The fan-out package has a re-distribution layer (RDL) that allows the construction of shorter die-to-die (D2D) interconnections between multiple chips. The fan-out package is treated as if it was a single die and then flip-chip mounted onto the BGA substrate.

 

ASE FOCoS Package Offerings

We offer a silicon bridge technology for implementing chiplet integration called FOCoS-B (Bridge), which utilizes tiny silicon pieces with routing layers as in-package interconnect between chiplets, e.g, graphics computing chips (GPU) and high bandwidth memory (HBM). The silicon bridges are embedded in the fan-out RDL layer as detailed below.

FOCoS-B is positioned as an alternative to 2.5D packages using silicon interposers. Like 2.5D, silicon bridges provide ultra-fine pitch interconnection in packages, which can address the memory bandwidth bottleneck challenges in systems. Compared with 2.5D, the advantages of FOCoS-B is that we only use silicon pieces in the areas where we are trying to connect two chiplets together.

There are two other types of fan-out chip on substrate (FOCoS) solutions: chips first (CF) and chips last (CL) as detailed below.

 

FOCoS-CF (Chip First)

 

This FOCoS-CF test vehicle consists of two ASIC chiplets facing down directly connecting with RDL through the Cu vias and no micro-bumps between the Si dies and fanout RDL (L/S 2/2 um).

FOCoS-CL (Chip Last)

 

The FOCoS-CL test vehicle is built up by three chiplets (1 ASIC die and 2 HBMs) in a side-by-side configuration. The ASIC die and 2 HBMs are connected through RDL (L/S 2/2 um) and Cu micro-bumps.

FOCoS-B (Bridge)

 

The FOCoS-B test vehicle consists of 2 chiplets (1 ASIC die and 1 HBMs). The Si bridge die (L/S 0.6/0.6 um) are embedded in the fan-out RDL layer (L/S 10/10 um) for making the connection between ASIC and HBM.



Benefits of Fan-Out Chip on Substrate (FOCoS)

FOCoS eliminates the need for an interposer which helps to reduce the package cost. FOCoS also has less insertion loss, better impedance control and lower warpage, thereby offering better electrical performance.

 

Key Advantages of Applying Fan-Out Chip on Substrate (FOCoS):

  • Lower cost (vs. 2.5D)
  • Thinner package
  • Good electrical performance (shorter D2D connect)
  • High I/O counts (> 1000)
  • Time to market with existing Fan-Out/Flip Chip techniques


Fan-Out Chip on Substrate (FOCoS) Applications

FOCoS is ideal for large package sizes and packages with high I/O density (> 1000 I/Os) that are designed for networking and server applications. The chip-last version of FOCoS can be used to package application-specific integrated circuits (ASICs) and high-bandwidth memories (HBM). Our various FOCoS solutions have provided a wide choice for chiplet integration in high performance computing (HPC) and artificial intelligence (AI)/machine learning (ML) applications.



FOCoS Assembly Design Kit (ADK)

ASE, in collaboration with Siemens Digital Industries Software OSAT Alliance Program*, has developed a fully validated ADK that helps customers create and evaluate complex FOCOS packages in an easy-to-use, data-robust graphical environment prior to and during physical design implementation. By adopting the Siemens Xpedition Substrate Integrator and Calibre® 3DSTACK technologies, and through integration with the current ASE design flow, this ADK can significantly reduce FOCoS package planning and verification cycle times by about 30 to 50 percent in each design iteration. The comprehensive design flow enables us to quickly and easily co-design FOCoS packages with our customers and close any physical verification issues.

For more information about ASE’s ADK news, please visit https://ase.aseglobal.com/en/press_room/content/high-density-advanced-package-designs-en.



為優化您的線上體驗,本網站使用Cookie。若您選擇繼續瀏覽本網站,視為您同意使用Cookie及接受本網站Cookie聲明條款。欲知悉更多Cookie的資訊,例如如何使用及停用Cookie,請參閱本網站Cookie聲明關於「如何變更Cookie設定或停用Cookie」的說明。