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Technology
System-in-Package
SiP Intelligent Design
Heterogeneous Integration
Antenna in Package
2.5D & 3D
TSV Interposer
Fan Out Packaging
Embedded Die Technology
FOCOS
MEMS & Sensors Packaging
Wafer Level Mems
Assembly
Flip Chip
Flip Chip CSP
Flip Chip BGA
FCBGA
FCCSP
HP Flip Chip BGA
Cu Pilliar
Solder Bumping
Wire Bond BGA
PBGA
HSBGA
FBGA
Leadframe
QFN
aQFN
QFP
LQFP/TQFP
PLCC
SO
PDIP
Wafer Level
aCSP/WLCSP
aWLP
WL IPD
WL MEMS
Substrate & Services
Packaging Substrate
Substrate Design
PBGA Substrate
BOC Substrate
Memory Card Substrate
Module Substrate
a-S3 Substrate
Advanced Substrate
Lab Service
Electrical
Material
Stress and Thermal
Chemical and Green
Failure Analysis
Optical
E-service
Bumping Service
Test Service
Test Service Offerings
Semiconductor Test
Tray Service
Tray Service Offerings
Investor Relations
Shareholder Services
Annual Reports
Dividends History
Shareholders' Meeting
Financials
Monthly Revenues
Quarterly Results
Financial Reports
Stock Exchange Filings
XBRL Files
Corporate Governance
Board of Directors
Corporate Governance Comparison
Conflict Minerals Compliance
Events & News
IR Events
IR News
FAQ
Sustainability
Governance
Corporate Sustainability Policy
Regulatory Compliance and Risk Management
Business Conduct and Ethics
Environment
Management System and Certification
The Building of Smart Grid
Water Reclamation
Green Facility
Sustainable Manufacturing
Green Bond
Employee
Human Rights Management
Employee Care
Employee Development
Employee Health and Safety
Supply Chain
Supplier Sustainability Management
Supplier Awards
Conflict Minerals Compliance
Social Involvement
Environmental Conservation
Industry-Academic Collaboration
Community Engagement
Public Advocacy
About ASE
Company Info
Milestones
Awards
Turnkey Services
Careers at ASE
Downloads
Press Center
Press Room
Events
Supply Chain
Management
Development
Supplier Self-recommendation
IP & Trademarks
Intellectual Property
ASE Trademarks
Contact Us
Manufacturing Facilities Overview
Plants & Offices Contacts
Sales, Media, CSR Contacts
English 中文
Technology
System-in-Package
SiP Intelligent Design
Heterogeneous Integration
Antenna in Package
2.5D & 3D
TSV Interposer
Fan Out Packaging
Embedded Die Technology
FOCOS
MEMS & Sensors Packaging
Wafer Level Mems
Assembly
Flip Chip
Flip Chip CSP
Flip Chip BGA
FCBGA
FCCSP
HP Flip Chip BGA
Cu Pilliar
Solder Bumping
Wire Bond BGA
PBGA
HSBGA
FBGA
Leadframe
QFN
aQFN
QFP
LQFP/TQFP
PLCC
SO
PDIP
Wafer Level
aCSP/WLCSP
aWLP
WL IPD
WL MEMS
Substrate & Services
Packaging Substrate
Substrate Design
PBGA Substrate
BOC Substrate
Memory Card Substrate
Module Substrate
a-S3 Substrate
Advanced Substrate
Lab Service
Electrical
Material
Stress and Thermal
Chemical and Green
Failure Analysis
Optical
E-service
Bumping Service
Test Service
Test Service Offerings
Semiconductor Test
Tray Service
Tray Service Offerings
Investor Relations
Shareholder Services
Annual Reports
Dividends History
Shareholders' Meeting
Financials
Monthly Revenues
Quarterly Results
Financial Reports
Stock Exchange Filings
XBRL Files
Corporate Governance
Board of Directors
Corporate Governance Comparison
Conflict Minerals Compliance
Events & News
IR Events
IR News
FAQ
Sustainability
Governance
Corporate Sustainability Policy
Regulatory Compliance and Risk Management
Business Conduct and Ethics
Environment
Management System and Certification
The Building of Smart Grid
Water Reclamation
Green Facility
Sustainable Manufacturing
Green Bond
Employee
Human Rights Management
Employee Care
Employee Development
Employee Health and Safety
Supply Chain
Supplier Sustainability Management
Supplier Awards
Conflict Minerals Compliance
Social Involvement
Environmental Conservation
Industry-Academic Collaboration
Community Engagement
Public Advocacy
About ASE
Company Info
Milestones
Awards
Turnkey Services
Careers at ASE
Downloads
Press Center
Press Room
Events
Supply Chain
Management
Development
Supplier Self-recommendation
IP & Trademarks
Intellectual Property
ASE Trademarks
Contact Us
Manufacturing Facilities Overview
Plants & Offices Contacts
Sales, Media, CSR Contacts
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Embedded Die Technology



a-EASI
SESUB



2.5D & 3D

Fan Out

SiP-id

System-in-Package

Flip Chip

TSV-Interposer Integration

WL IPD

WL MEMS

MEMS & Sensors

Embedded Die Technology

Semiconductor Test

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